Saksham Jain
@sakshjn
Applied Scientist Intern @Amazon · Ex-Research Intern @MIT_CSAIL,
@UofSC (#AIISC#)
mail: sakshamjaindtu@gmail.com
参加 July 2026
1.2K フォロー中 342 ファン
tddb is weakest-link statistics, failure odds grow with dielectric area, and a wse-3 is ~57x an h100 die
so it hinges on whether they can map out a short in the field the way they route around fab defects
もっと見る
