Saksham Jain
@sakshjn
Applied Scientist Intern @Amazon · Ex-Research Intern @MIT_CSAIL,
@UofSC (#AIISC#)
mail: sakshamjaindtu@gmail.com
1.2K Following 342 Followers
tddb is weakest-link statistics, failure odds grow with dielectric area, and a wse-3 is ~57x an h100 die
so it hinges on whether they can map out a short in the field the way they route around fab defects
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@aidangomez a trace that says no tool calls right before it makes them breaks a lot of the cot monitoring people are leaning on for agents
